Scaling analysis of the static and dynamic critical exponents in underdoped, overdoped, and optimally doped Pr2-x Cex CuO4-y films
We report on current-voltage measurements of the zero-field normal-superconducting phase transition in thin films of Pr Ce CuO as a function of doping. We find that the small size of the critical regime in these materials (25 mK) gives rise to mean-field behavior at the phase transition with a static exponent of ν 0.5 for all dopings (in contrast to hole-doped YBa Cu O -δ). We also find mean-field behavior in the dynamic exponent z. This indicates that Pr Ce CuO behaves similarly to conventional superconductors in contrast to other cuprate superconductors. However, as the transition width in our samples decreases, the dynamic critical exponent approaches z=1.5, similar to the critical exponent found in hole-doped YBa Cu O -δ. © 2010 The American Physical Society. 2-x x 4-y 2 3 7 2-x x 4-y 2 3 7
Physical Review B - Condensed Matter and Materials Physics
Sullivan, M. C.; Isaacs, R. A.; Salvaggio, M. F.; Sousa, J.; Stathis, C. G.; and Olson, J. B., "Scaling analysis of the static and dynamic critical exponents in underdoped, overdoped, and optimally doped Pr2-x Cex CuO4-y films" (2010). Faculty Articles Indexed in Scopus. 1486.